Publications in OpenAlex of which a co-author is affiliated to this organization
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| Title | DOI |
|---|---|
| https://doi.org/10.1109/stherm.2012.6188828 | Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching |
| https://doi.org/10.1109/ets.2017.7968215 | Automatic testing of analog ICs for latent defects using topology modification |
| https://doi.org/10.1109/apec43599.2022.9773399 | Transient Overvoltage Detection Technique for GaN HEMTs Integrated in a 200-V GaN-on-SOI Process |
| https://doi.org/10.1109/iirw49815.2020.9312869 | ON-State Gate Stress Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs |
| https://doi.org/10.1111/jerd.12324 | An esthetic evaluation of unilateral canine substitution for a missing maxillary lateral incisor |
| https://doi.org/10.1109/vts48691.2020.9107625 | Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing |
| https://doi.org/10.3850/9783981537079_0776 | Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries |
| https://doi.org/10.1109/temc.2017.2769021 | Improved Estimation of Radiated Fields of Unintentional Radiators by Correction of the Impedance Mismatch Between a Transverse Electromagnetic Cell and a Hybrid Coupler |
| https://doi.org/10.1109/apec.2015.7104508 | Unified theory of reverse blocking dynamics in high-voltage cascode devices |
| https://doi.org/10.1016/j.microrel.2007.07.039 | Lifetime modeling of intrinsic gate oxide breakdown at high temperature |
| https://doi.org/10.1002/pa.2567 | The public affairs plan: Seven steps to success rooted in science and practice |
| https://doi.org/10.1109/itc44778.2020.9325230 | Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs |
| https://doi.org/10.1109/ispsd59661.2024.10579599 | A Physics-Oriented Analysis of SiC Trench MOSFETs Under Gate Switching Stress Test Conditions |
| https://doi.org/10.1109/relphy.2005.1493147 | Electron trapping and interface trap generation in drain extended pMOS transistors |
| https://doi.org/10.1109/iedm.2006.347000 | Analysis and Modeling of Lateral Non-Uniform Doping in High-Voltage MOSFETs |
| https://doi.org/10.1109/iedm.2007.4419089 | Stress-Induced Mobility Enhancement for Integrated Power Transistors |
| https://doi.org/10.1109/test.2016.7805830 | Effective DC fault models and testing approach for open defects in analog circuits |
| https://doi.org/10.1016/j.microrel.2008.06.048 | Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOS |
| https://doi.org/10.1109/isqed.2006.7 | A Compact DC and AC Model for Circuit Simulation of High Voltage VDMOS Transistor |
| https://doi.org/10.1109/ets.2014.6847817 | Optimization of analog fault coverage by exploiting defect-specific masking |
| https://doi.org/10.1109/ispsd.2011.5890853 | Energy limits for unclamped inductive switching in high-voltage planar and SuperJunction power MOSFETs |
| https://doi.org/10.1109/mpel.2015.2447671 | Breakthroughs for 650-V GaN Power Devices: Stable high-temperature operations and avalanche capability |
| https://doi.org/10.1016/j.microrel.2012.06.131 | Wafer scale and reliability investigation of thin HfO2·AlGaN/GaN MIS-HEMTs |
| https://doi.org/10.1007/s11356-018-2017-z | Integration of a photocatalytic multi-tube reactor for indoor air purification in HVAC systems: a feasibility study |
| https://doi.org/10.1109/irps.2019.8720521 | A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability |
| https://doi.org/10.1109/tpel.2018.2837747 | Improving the Third Quadrant Operation of Superjunction MOSFETs by Using the Cascode Configuration |
| https://doi.org/10.23919/ispsd.2017.7988916 | Short-circuit capability in p-GaN HEMTs and GaN MISHEMTs |
| https://doi.org/10.1109/mipro.2015.7160245 | SPICE analysis of RL and RC snubber circuits for synchronous buck DC-DC converters |
| https://doi.org/10.1016/j.vlsi.2016.05.001 | Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization |
| https://doi.org/10.1016/j.microrel.2011.06.037 | Electric field unbalance for robust floating ring termination |
| https://doi.org/10.1109/ispsd.2011.5890825 | Solutions to improve flatness of Id-Vd curves of rugged nLDMOS |
| https://doi.org/10.1109/ispsd46842.2020.9170091 | SiC MOSFET Corner and Statistical SPICE Model Generation |
| https://doi.org/10.1109/ispsd.2012.6229029 | A high-speed silicon FET for efficient DC-DC power conversion |
| https://doi.org/10.1109/sapiw.2016.7496298 | High-frequency modelling of surface-mount power inductor used in switching DC-DC converters |
| https://doi.org/10.1093/asj/sjaa007 | Spreading Pattern and Tissue Response to Hyaluronic Acid Gel Injections in the Subcutis: Ultrasound Videos, Ultrasound Measurements, and Histology |
| https://doi.org/10.1109/icicdt.2015.7165899 | Trapping induced parasitic effects in GaN-HEMT for power switching applications |
| https://doi.org/10.1109/esscir.2004.1356610 | Technology considerations for automotive [automotive electronics] |
| https://doi.org/10.1109/icicdt.2011.5783216 | On the impact of the edge profile of interconnects on the occurrence of passivation cracks of plastic-encapsulated electronic power devices |
| https://doi.org/10.1016/j.microrel.2017.06.021 | Field and hot electron-induced degradation in GaN-based power MIS-HEMTs |
| https://doi.org/10.1109/radecs.2013.6937427 | 5 MeV proton and 15 MeV electron radiation effects study on 4H-SiC nMOSFET electrical parameters |
| https://doi.org/10.1109/ipfa.2007.4378103 | Study of Time-Dependent Dielectric Breakdown on Gate Oxide Capacitors at High Temperature |
| https://doi.org/10.1109/essderc.2015.7324714 | Technology and design of GaN power devices |
| https://doi.org/10.1109/ets.2017.7968225 | A very low cost and highly parallel DfT method for analog and mixed-signal circuits |
| https://doi.org/10.1002/hep.31186 | Could Autoimmune Disease Contribute to the Abscopal Effect in Metastatic Hepatocellular Carcinoma? |
| https://doi.org/10.1109/ias.2010.5616897 | ISO Efficiency Curves of a -Two-Phase Hybrid Stepping Motor |
| https://doi.org/10.1109/compel.2016.7556703 | Modeling the switching behaviour of SuperJunction MOSFETs in cascode configuration with a low voltage silicon MOSFET |
| https://doi.org/10.1109/ecce.2016.7855478 | SuperJunction cascode, a configuration to break the silicon switching frequency limit |
| https://doi.org/10.1016/j.mssp.2021.106157 | Selective wet etching and hydrolysis of polycrystalline AlN films grown by metal organic chemical vapor deposition |
| https://doi.org/10.1109/icecs.2009.5410982 | Equivalent circuit model of the TEM cell electric and magnetic field coupling to microstrip lines |
| https://doi.org/10.1109/ispsd46842.2020.9170056 | The Floating NBL Architecture: Enabler of a Quasi-SOI process |
| https://doi.org/10.1109/irps46558.2021.9405169 | Assessing SiCr resistor drift for automotive analog ICs |
| https://doi.org/10.1016/j.micpro.2015.05.013 | Addressing the Smart Systems design challenge: The SMAC platform |
| https://doi.org/10.1016/j.mssp.2021.105806 | The role of AlGaN/GaN heterostructure properties in barrier height variation of Au-free ohmic contacts |
| https://doi.org/10.1109/ispsd49238.2022.9813614 | Cryogenic Ultra-Fast Bias Temperature Instability Trap Profiling of SiC MOSFETs |
| https://doi.org/10.1080/07853890.2024.2310132 | Opioids in geriatric units in 14 Belgian hospitals: prevalence, dosage and associated factors |
| https://doi.org/10.1109/irps48203.2023.10117802 | The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study |
| https://doi.org/10.1109/essder.2004.1356480 | Technology considerations for automotive |
| https://doi.org/10.1016/j.microrel.2010.07.117 | Next generation of Deep Trench Isolation for Smart Power technologies with 120V high-voltage devices |
| https://doi.org/10.1109/tsm.2008.2004339 | Dielectric Relaxation of MIM Capacitor and Its Effect on Sigma-Delta A/D Converters |
| https://doi.org/10.1109/essder.2004.1356589 | Analysis and application of energy capability characterization methods in power MOSFETs |
| https://doi.org/10.1109/jsen.2014.2332635 | PTC-Based Sigma-Delta ADCs for High-Speed, Low-Noise Imagers |
| https://doi.org/10.1109/led.2004.832533 | Spatial Distribution of Interface Traps in DeMOS Transistors |
| https://doi.org/10.1109/apec.2017.7930964 | dv/dt Immunization limit of LV MOSFET in cascode GaN FET and dv/dt safe chart for MOSFETs |
| https://doi.org/10.55465/fkrg7872 | Het karmelietenklooster van Aalst (prov. Oost-Vl.)(1497-1797): het gebouwenbestand, de begravingenen het fysisch-antropologische onderzoek |
| https://doi.org/10.1109/iedm.2006.346999 | Hole Trapping and de-Trapping Effects in LDMOS Devices under Dynamic Stress |
| https://doi.org/10.1016/s0026-2714(03)00162-8 | Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages |
| https://doi.org/10.1109/essderc.2007.4430968 | Theoretical analysis of XtreMOS<sup>™</sup> power transistors |
| https://doi.org/10.1109/ispsd.2009.5158008 | Accumulation region length impact on 0.18µm CMOS fully-compatible lateral power MOSFETs with Shallow Trench Isolation |
| https://doi.org/10.1186/s13362-016-0025-5 | Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation |
| https://doi.org/10.1109/led.2006.875146 | Ultrafast floating 75-V lateral IGBT with a buried hole diverter and an effective junction isolation |
| https://doi.org/10.1109/tsm.2011.2106522 | Wafer Bevel Protection During Deep Reactive Ion Etching |
| https://doi.org/10.1109/ispsd.2007.4294970 | A Multiple Deep Trench Isolation Structure with Voltage Divider Biasing |
| https://doi.org/10.1109/essder.2005.1546637 | Precise analogue characterization of MIM capacitors using an improved charge-based capacitance measurement (CBCM) technique |
| https://doi.org/10.1109/irps.2015.7112687 | Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors |
| Suitable operation conditions for different 100V trench-based power MOSFETs in 48V-input synchronous buck converters | |
| https://doi.org/10.1109/emceurope.2008.4786908 | Scaleable equivalent circuit modelling of the E-field coupling to microstrips in the TEM cell |
| https://doi.org/10.1109/ispsd.2012.6229095 | Enhancing the robustness of a multiple floating field-limiting ring termination by introducing a buffer layer |
| https://doi.org/10.1109/ecce.2011.6063752 | The opportunities of two-phase hybrid stepping motor back EMF sampling |
| https://doi.org/10.1109/vlsid.2007.15 | A New Charge based Compact Model for Lateral Asymmetric MOSFET and its application to High Voltage MOSFET Modeling |
| https://doi.org/10.1109/led.2007.895402 | A New Lateral-IGBT Structure With a Wider Safe Operating Area |
| https://doi.org/10.1109/irps.2016.7574585 | On conduction mechanisms through SiN/AlGaN based gate dielectric and assessment of intrinsic reliability |
| https://doi.org/10.1109/test.2016.7805867 | Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis |
| https://doi.org/10.1109/emccompo.2017.7998088 | EMC-oriented design of output stage of synchronous buck converter |
| https://doi.org/10.1109/ecce44975.2020.9235899 | A physical investigation of large-signal dynamic output capacitance and energy loss in GaN-on-Si power HEMTs at high-frequency applications |
| https://doi.org/10.1097/00002480-199207000-00048 | Polyunsaturated Fatty Acids of the n-3 Class in Chronic Dialysis |
| https://doi.org/10.1016/j.microrel.2012.06.094 | Influence of charge balance on the robustness of trench-based super junction diodes |
| https://doi.org/10.1109/edssc.2016.7785225 | Modeling of high voltage LDMOSFET using industry standard BSIM6 MOS model |
| https://doi.org/10.1049/iet-pel.2017.0392 | Overcoming switching limits in silicon power MOSFETs with silicon‐based solutions |
| https://doi.org/10.1109/tpel.2017.2761823 | Evaluation of Superjunction MOSFETs in Cascode Configuration for Hard-Switching Operation |
| https://doi.org/10.1109/eurosime.2019.8724511 | Improved QFN thermal cycling reliability using low melting temperature SnBi based solder paste LMPA-Q |
| https://doi.org/10.1109/irps45951.2020.9129116 | Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and Hard- Switching Conditions |
| https://doi.org/10.1109/ets48528.2020.9131593 | Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing |
| https://doi.org/10.1109/tpel.2022.3220978 | Short Circuits in GaN HEMTs: Test Bench Setup and Characterization |
| https://doi.org/10.1109/essder.2004.1356591 | A new substrate current free nLIGBT for junction isolated technologies |
| https://doi.org/10.1002/mmce.20056 | Detecting variations of small-signal equivalent-circuit model parameters in the Si/SiGe HBT process with ANN |
| https://doi.org/10.1109/esime.2004.1304014 | Trends in automotive electronics |
| The application of large-signal calibration techniques yields unprecedented insight during TLP and ESD testing | |
| https://doi.org/10.3850/9783981537079_0996 | Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs |
| Electro-thermal characterization and simulation of integrated multi trenched XtreMOS power devices | |
| https://doi.org/10.1109/apec.2017.7930968 | Reducing Qrr in high-voltage SuperJunction MOSFETs by using the cascode configuration |