Publications in OpenAlex of which a co-author is affiliated to this organization
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| Title | DOI |
|---|---|
| https://doi.org/10.1109/iitc.2002.1014959 | Atomic layer deposition of barriers for interconnect |
| https://doi.org/10.1117/12.2224042 | LED light engine concept with ultra-high scalable luminance |
| https://doi.org/10.1007/978-3-642-69389-2_5 | Bootstrap methods, sampling distributions |
| https://doi.org/10.1186/s41687-025-00980-4 | Patient-reported outcome and experience measures in cardiovascular disease: a scoping review as part of iCARE4CVD |
| https://doi.org/10.1007/978-3-642-83069-3 | Pattern Recognition Theory and Applications |
| https://doi.org/10.1016/0743-7315(86)90008-0 | Strategies for interconnection networks: Some methods from graph theory |
| Recursive neural networks for associative memory | |
| https://doi.org/10.1080/15326348908807110 | The n/g/l finite capacity queue |
| https://doi.org/10.1016/0166-218x(88)90034-0 | Minimal test patterns for connectivity preservation in parallel thinning algorithms for binary digital images |
| https://doi.org/10.1007/3-540-46885-4_43 | How easy is collision search? Application to DES |
| https://doi.org/10.1016/s0167-6911(84)80033-x | Reduced order observers: A new algorithm and proof |
| https://doi.org/10.1007/3-540-47721-7_9 | Public-key Systems Based on the Difficulty of Tampering (Is there a difference between DES and RSA?) |
| https://doi.org/10.1109/led.2005.861404 | Work function of Ni silicide phases on HfSiON and SiO/sub 2/: NiSi, Ni/sub 2/Si, Ni/sub 31/Si/sub 12/, and Ni/sub 3/Si fully silicided gates |
| https://doi.org/10.1016/j.mseb.2004.07.028 | Ni based silicides for 45nm CMOS and beyond |
| https://doi.org/10.1109/iedm.2005.1609503 | Device and circuit-level analog performance trade-offs: a comparative study of planar bulk FETs versus FinFETs |
| https://doi.org/10.1109/tit.1982.1056525 | Algebraic constructions of Shannon codes for regular channels |
| https://doi.org/10.1016/0024-3795(86)90173-4 | On the quadratic convergence of Kogbetliantz's algorithm for computing the singular value decomposition |
| https://doi.org/10.1109/led.2004.824242 | Revised Method for Extraction of the Thermal Resistance Applied to Bulk and SOI SiGe HBTs |
| https://doi.org/10.1148/radiol.2471070685 | Pancreatic Perfusion: Noninvasive Quantitative Assessment with Dynamic Contrast-enhanced MR Imaging without and with Secretin Stimulation in Healthy Volunteers—Initial Results |
| https://doi.org/10.1007/bf00264015 | Formal derivation of strongly correct concurrent programs |
| https://doi.org/10.1109/jsen.2003.816261 | A hygrometer comprising a porous silicon humidity sensor with phase-detection electronics |
| https://doi.org/10.1159/000102978 | Prevalence and Determinants of Coronary and Aortic Calcifications Assessed by Chest CT in Renal Transplant Recipients |
| https://doi.org/10.1109/.2005.1469257 | Experimental and comparative investigation of low and high field transport in substrate- and process-induced strained nanoscaled MOSFETs |
| https://doi.org/10.1109/iedm.2005.1609354 | Dielectric resurf: breakdown voltage control by STI layout in standard CMOS |
| https://doi.org/10.1007/978-94-009-0501-6_5 | On the Role of Orthogonal Polynomials on the Unit Circle in Digital Signal Processing Applications |
| https://doi.org/10.1016/j.mseb.2003.10.052 | MBE lanthanum-based high-k gate dielectrics as candidates for SiO2 gate oxide replacement |
| https://doi.org/10.1016/s0195-6698(85)80039-1 | On the Nonbinary Johnson Scheme |
| https://doi.org/10.1063/1.1869540 | Low-temperature diffusion of high-concentration phosphorus in silicon, a preferential movement toward the surface |
| https://doi.org/10.1063/1.2163985 | Characterization of field-effect transistors with La2Hf2O7 and HfO2 gate dielectric layers deposited by molecular-beam epitaxy |
| https://doi.org/10.1016/s0167-9317(03)00366-6 | Thickness scaling issues of Ni silicide |
| https://doi.org/10.1109/tassp.1983.1164154 | Optimal design of minimum-phase FIR filters |
| https://doi.org/10.1016/j.sse.2004.08.021 | Tunneling 1/fγ noise in 5nm HfO2/2.1nm SiO2 gate stack n-MOSFETs |
| https://doi.org/10.1021/jp800675w | Screening and Separation of Charges in Microscale Devices: Complete Planar Solution of the Poisson−Boltzmann Equation |
| https://doi.org/10.1117/12.354385 | Novel aberration monitor for optical lithography |
| https://doi.org/10.1002/jmri.25089 | Liver apparent diffusion coefficient repeatability with individually predetermined optimal cardiac timing and artifact elimination by signal filtering |
| https://doi.org/10.1016/0167-8655(86)90066-8 | On the editing rate of the Multiedit algorithm |
| https://doi.org/10.1016/j.sse.2009.09.007 | Quantitative prediction of junction leakage in bulk-technology CMOS devices |
| https://doi.org/10.1016/j.mee.2004.07.048 | Low temperature spike anneal for Ni-silicide formation |
| https://doi.org/10.1109/ted.2006.873848 | A new analytical model for the thermal resistance of deep-trench bipolar transistors |
| https://doi.org/10.1109/iedm.2004.1419129 | A 0.314μm/sup 2/ 6T-SRAM cell build with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithography |
| https://doi.org/10.1159/000127439 | Cigarette Smoke Exposure Promotes Arterial Thrombosis and Vessel Remodeling after Vascular Injury in Apolipoprotein E-Deficient Mice |
| https://doi.org/10.1007/s00256-017-2580-2 | Low-dose CT imaging of a total hip arthroplasty phantom using model-based iterative reconstruction and orthopedic metal artifact reduction |
| https://doi.org/10.1109/iedm.2005.1609500 | Demonstration of recessed SiGe S/D and inserted metal gate on HfO/sub 2/ for high performance pFETs. |
| https://doi.org/10.1117/1.oe.54.5.055101 | Incoupling and outcoupling of light from a luminescent rod using a compound parabolic concentrator |
| https://doi.org/10.1016/j.mee.2004.07.019 | Impact of different slurry and polishing pad choices on the planarization efficiency of a copper CMP process |
| https://doi.org/10.1109/mwsym.2005.1516931 | Active-inductor-based low-power broadband harmonic VCO in SiGe technology for wideband and multi-standard applications |
| https://doi.org/10.3390/electronics10060748 | Keyframe Insertion: Enabling Low-Latency Random Access and Packet Loss Repair |
| https://doi.org/10.1088/1742-6596/2042/1/012033 | An assessment of operational economic benefits of renewable energy communities in Belgium |
| https://doi.org/10.1109/ted.2005.864382 | Effect of the gap size on the SSI efficiency of split-gate memory cells |
| https://doi.org/10.1007/s00330-017-5021-7 | Could new reconstruction CT techniques challenge MRI for the detection of brain metastases in the context of initial lung cancer staging? |
| https://doi.org/10.1109/.2005.1469230 | Integration of tall triple-gate devices with inserted-Ta/sub x/N/sub y/ gate in a 0.274μm/sup 2/ 6t-sram cell and advanced CMOS logic circuits |
| https://doi.org/10.3390/rs15204950 | Study on the Potential of Oil Spill Monitoring in a Port Environment Using Optical Reflectance |
| https://doi.org/10.1145/3130859.3131308 | The Design of a Virtual Reality Game for Stroke-Induced Attention Deficits |
| https://doi.org/10.1080/17843286.2022.2068296 | Changes in the use and uptake of a national out-of-hours telephone triage service by younger and older patients seeking non-urgent unplanned care surrounding the COVID-19 pandemic in Flanders (Belgium) |
| https://doi.org/10.1063/1.4801850 | Note: Measuring breakdown characteristics during the hot re-ignition of high intensity discharge lamps using high frequency alternating current voltage |
| https://doi.org/10.1016/0167-6911(86)90026-5 | A reduced order observer for descriptor systems |
| https://doi.org/10.1016/0304-3975(86)90164-7 | A topological characterization of thinning |
| https://doi.org/10.1007/bfb0031053 | Spectral properties of finite Toeplitz matrices |
| https://doi.org/10.1007/978-1-4612-5648-9_13 | Cubature Formulae, Polytopes, and Spherical Designs |
| https://doi.org/10.1007/bf01398880 | On efficient implementations of Kogbetliantz's algorithm for computing the singular value decomposition |
| https://doi.org/10.1109/iedm.2001.979469 | CMOS device optimization for mixed-signal technologies |
| https://doi.org/10.1109/34.16713 | A bibliography on digital and computational convexity (1961-1988) |
| https://doi.org/10.1109/proc.1986.13644 | A knowledge representation language for requirements engineering |
| https://doi.org/10.1109/.2005.1469231 | Tall triple-gate devices with TiN/HfO/sub 2/ gate stack |
| https://doi.org/10.1109/ted.2005.845078 | Cryogenic Operation of Third-Generation, 200-GHz Peak-<tex>$f_T$</tex>, Silicon–Germanium Heterojunction Bipolar Transistors |
| https://doi.org/10.1016/s0167-9317(02)00795-5 | Development of sub-10-nm atomic layer deposition barriers for Cu/low-k interconnects |
| https://doi.org/10.1109/tit.1981.1056290 | Bounds and constructions for binary asymmetric error-correcting codes (Corresp.) |
| https://doi.org/10.1016/j.mssp.2004.09.011 | Application of Ru-based gate materials for CMOS technology |
| https://doi.org/10.1063/1.1904159 | Atomistic analysis of the evolution of boron activation during annealing in crystalline and preamorphized silicon |
| https://doi.org/10.1063/1.1882756 | Enhanced boron activation in silicon by high ramp-up rate solid phase epitaxial regrowth |
| https://doi.org/10.1016/0955-2219(94)90117-1 | On the mechanism of delamination fracture of BaTiO3-based PTC thermistors |
| https://doi.org/10.1109/iedm.2003.1269287 | Performance comparison of sub 1 nm sputtered TiN/HfO/sub 2/ nMOS and pMOSFETs |
| https://doi.org/10.1149/1.1447946 | Examination of the Si(111)-SiO[sub 2], Si(110)-SiO[sub 2], and Si(100)-SiO[sub 2] Interfacial Properties Following Rapid Thermal Annealing |
| https://doi.org/10.1116/1.1638774 | Leakage optimization of ultra-shallow junctions formed by solid phase epitaxial regrowth |
| https://doi.org/10.1007/3-540-46885-4_13 | 2n-Bit Hash-Functions Using n-Bit Symmetric Block Cipher Algorithms |
| https://doi.org/10.1109/bipol.2005.1555196 | Unilfied electro-thermal stability criterion for bipolar transistors |
| https://doi.org/10.1016/j.mee.2005.07.014 | Advanced Cu interconnects using air gaps |
| https://doi.org/10.1117/12.962267 | Updating Singular Value Decompositions. A Parallel Implementation. |
| https://doi.org/10.1016/j.apsusc.2003.08.030 | A new technique to fabricate ultra-shallow-junctions, combining in situ vapour HCl etching and in situ doped epitaxial SiGe re-growth |
| https://doi.org/10.1109/iedm.2002.1175795 | Compact modeling of drain and gate current noise for RF CMOS |
| https://doi.org/10.1063/1.1866640 | Band alignment at the interface of (100)Si with HfxTa1−xOy high-κ dielectric layers |
| https://doi.org/10.1016/s0195-6698(85)80004-4 | On a Pair of Dual Subschemes of the Hamming Scheme Hn(q) |
| https://doi.org/10.1109/ted.2004.838449 | Scaling of Characteristic Frequencies in RF CMOS |
| https://doi.org/10.1007/978-3-642-83069-3_13 | Learning the Parameters of a Hidden Markov Random Field Image Model: A Simple Example |
| https://doi.org/10.1109/iedm.2006.346954 | Doubling or quadrupling MuGFET fin integration scheme with higher pattern fidelity, lower CD variation and higher layout efficiency |
| https://doi.org/10.1109/led.2004.838557 | Impact Ionization in Thin Silicon Diodes |
| https://doi.org/10.1109/69.88002 | Controlled generation of intensional answers |
| https://doi.org/10.1016/s0167-9317(03)00381-2 | Material modification of the patterned wafer during dry etching and strip determined by XPS |
| https://doi.org/10.1080/00994480.1997.10748174 | Metal Halide Lamps with Ceramic Envelopes: A Breakthrough in Color Control |
| https://doi.org/10.1116/1.1643053 | Chemical and electrical dopants profile evolution during solid phase epitaxial regrowth |
| https://doi.org/10.1109/tcs.1985.1085753 | Minimal realizations of pseudo-positive and pseudo-bounded rational matrices |
| https://doi.org/10.1109/bipol.2006.311150 | Physical Description of the Mixed-Mode Degradation Mechanism for High Performance Bipolar Transistors |
| https://doi.org/10.1109/ispsd.2002.1016215 | Manufacturing of high aspect-ratio p-n junctions using vapor phase doping for application in multi-Resurf devices |
| https://doi.org/10.1109/led.2005.855413 | In-depth characterization of the hole mobility in 50-nm process-induced strained MOSFETs |
| https://doi.org/10.1109/icmts.2006.1614265 | Specific contact resistance measurements of metal-semiconductor junctions |
| https://doi.org/10.1023/a:1006618806152 | Aging of NTC ceramics investigated by magnetic measurements |
| https://doi.org/10.1016/j.ijrmhm.2005.10.010 | Numerical simulation of the drawing process of tungsten wires |
| https://doi.org/10.1109/led.2006.877711 | Accurate channel length extraction by split C-V measurements on short-channel MOSFETs |
| https://doi.org/10.1016/0167-8655(85)90035-2 | A multiclass, k-NN approach to Bayes risk estimation |
| https://doi.org/10.1016/j.mee.2005.04.050 | Band alignment between (100)Si and Hf-based complex metal oxides |
