Publications in OpenAlex of which a co-author is affiliated to this organization
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| Title | DOI |
|---|---|
| https://doi.org/10.1111/j.1523-5378.2006.00454.x | Helicobacter pylori Infection: Further Evidence for the Role of Feco‐Oral Transmission |
| https://doi.org/10.1186/s13362-016-0030-8 | Parametric modeling and model order reduction for (electro-)thermal analysis of nanoelectronic structures |
| https://doi.org/10.1109/tmag.2015.2479361 | Uncertainty Quantification for Robust Topology Optimization of Power Transistor Devices |
| https://doi.org/10.1145/2429384.2429472 | A fast time-domain EM-TCAD coupled simulation framework via matrix exponential |
| https://doi.org/10.1109/tcad.2015.2488494 | An Efficient Transient Electro-Thermal Simulation Framework for Power Integrated Circuits |
| https://doi.org/10.1109/tcad.2010.2103270 | An Effective Formulation of Coupled Electromagnetic-TCAD Simulation for Extremely High Frequency Onward |
| https://doi.org/10.1109/ted.2014.2314485 | In-Depth Electromagnetic Analysis of ESD Protection for Advanced CMOS Technology During Fast Transient and High-Current Surge |
| https://doi.org/10.3850/9783981537079_0776 | Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries |
| https://doi.org/10.1016/j.ifacol.2015.05.212 | Model Order Reduction of an Electro-Thermal Package Model |
| https://doi.org/10.1108/03321640810878225 | Models for integrated components coupled with their EM environment |
| https://doi.org/10.1109/therminic.2013.6675199 | Fully-coupled 3D electro-thermal field simulator for chip-level analysis of power devices |
| https://doi.org/10.1109/tcad.2012.2232709 | A Numerically Efficient Formulation for Time-Domain Electromagnetic-Semiconductor Cosimulation for Fast-Transient Systems |
| https://doi.org/10.1109/icicdt.2011.5783184 | ESD RF protections in advanced CMOS technologies and its parasitic capacitance evaluation |
| https://doi.org/10.1186/s13362-016-0025-5 | Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation |
| https://doi.org/10.17617/2.2223025 | Application of Krylov-type Parametric Model Order Reduction in Efficient Uncertainty Quantification of Electro-thermal Circuit Models |
| https://doi.org/10.1109/tcad.2014.2303050 | Computation of Self-Induced Magnetic Field Effects Including the Lorentz Force for Fast-Transient Phenomena in Integrated-Circuit Devices |
| https://doi.org/10.3850/9783981537079_0995 | Holistic Coupled Field and Circuit Simulation |
| https://doi.org/10.3850/9783981537079_0996 | Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs |
| https://doi.org/10.1109/date.2012.6176679 | Large signal simulation of integrated inductors on semi-conducting substrates |
| https://doi.org/10.1109/essderc.2007.4430904 | Modeling of passive-active device interactions |
| https://doi.org/10.1016/j.ifacol.2015.05.206 | Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device |
| https://doi.org/10.1016/j.sse.2011.06.006 | On the inclusion of Lorentz force effects in TCAD simulations |
| https://doi.org/10.1145/3061639.3062219 | Coupled circuit/EM simulation for radio frequency circuits |
| https://doi.org/10.1016/j.ssc.2008.04.025 | Quantum transport in an ultra-thin SOI MOSFET: Influence of the channel thickness on the I–V characteristics |
| https://doi.org/10.1145/2966986.2966993 | A new tightly-coupled transient electro-thermal simulation method for power electronics |
| https://doi.org/10.1007/s11255-021-02814-w | Biomechanics of the urinary bladder: spontaneous contraction activity and micromotions related to accommodation |
| https://doi.org/10.1093/occmed/43.2.78 | Back pain and its correlates among workers in family care |
| https://doi.org/10.1016/s1570-8659(04)13001-9 | Introduction to Electromagnetism |
| https://doi.org/10.3850/9783981537079_0998 | Shape Optimization of a Power MOS Device Under Uncertainties |
| https://doi.org/10.1007/978-3-030-30726-4 | Nanoelectronic Coupled Problems Solutions |
| https://doi.org/10.1088/0953-2048/22/2/025001 | Control and readout of current-induced magnetic flux quantization in a superconducting transformer |
| https://doi.org/10.1016/j.amc.2017.04.024 | An index-aware parametric model order reduction method for parameterized quadratic differential–algebraic equations |
| https://doi.org/10.1007/978-3-030-30726-4_9 | Uncertainty Quantification: Introduction and Implementations |
| https://doi.org/10.1007/978-3-642-12294-1_41 | Evaluation of Electromagnetic Coupling Between Microelectronic Device Structures Using Computational Electrodynamics |
| https://doi.org/10.1109/spi.2008.4558351 | Domain Decomposition via Electromagnetic Hooks for the Modeling of Complete RF blocks |
| https://doi.org/10.1016/j.mee.2009.06.021 | Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45nm nodes |
| https://doi.org/10.1016/j.sse.2004.07.017 | Simulation of interconnect structures using ghost-field solving methods |
| https://doi.org/10.1109/essderc.2010.5618394 | On the inclusion of Lorentz force effects in TCAD simulations |
| https://doi.org/10.1007/978-3-319-30399-4_16 | Parametric and Reduced-Order Modeling for the Thermal Analysis of Nanoelectronic Structures |
| https://doi.org/10.1007/978-3-319-75538-0_7 | Coupled Circuit Device Simulation |
| https://doi.org/10.1109/essderc.2011.6044162 | EM-TCAD solving from 0–100 THz: A new implementation of an electromagnetic solver |
| https://doi.org/10.1016/j.microrel.2017.06.073 | Exploration of robustness limits and ESD EMI impact in a protection device for advanced CMOS technology |
| https://doi.org/10.1007/978-3-319-23413-7_116 | The European Project nanoCOPS for Nanoelectronic Coupled Problems Solutions |
| https://doi.org/10.1007/978-3-319-23413-7_115 | Fully-Coupled Electro-Thermal Power Device Fields |
| https://doi.org/10.1007/978-3-030-30726-4_22 | Validation of Simulation Results on Coupled Problems |
| https://doi.org/10.1007/978-3-030-30726-4_19 | Ageing Models and Reliability Prediction |
| https://doi.org/10.1007/978-3-030-30726-4_23 | Methodology and Best-Practice Guidelines for Thermally Optimized Driver Design |
| https://doi.org/10.1016/j.microrel.2015.06.091 | Coupled electro-magnetic field & Lorentz force effects in silicon and metal for ESD investigation in transient and harmonic regimes |
| https://doi.org/10.48550/arxiv.1610.04303 | Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries |
| https://doi.org/10.1007/978-3-211-72861-1_80 | Maxwell Equations on Unstructured Grids Using Finite-Integration Methods |
| https://doi.org/10.1109/ulis.2009.4897608 | Quantized logic switch implementation through a superconducting transformer |
| https://doi.org/10.1109/essderc.2003.1256801 | Coupled device, circuit and interconnect simulation |
| https://doi.org/10.1007/3-540-28073-1_6 | Simulation and Measurement of Interconnects and On-Chip Passives: Gauge Fields and Ghosts as Numerical Tools |
| https://doi.org/10.1109/icicdt.2015.7165910 | Integrated front-end/back-end simulation of electromagnetic fields, Lorentz force effects and fast current surges in microelectronic protection devices |
| https://doi.org/10.1007/978-3-642-12294-1_49 | Simulation of Large Interconnect Structures Using ILU-Type Preconditioner |
| https://doi.org/10.1002/cta.2109 | A fast time‐domain EM–TCAD coupled simulation framework via matrix exponential with stiffness reduction |
| https://doi.org/10.1109/sispad.2003.1233651 | On the inclusion of floating domains in electromagnetic field solvers |
| https://doi.org/10.1002/jnm.569 | High-frequency simulations and compact models compared with measurements for passive on-chip components |
| High-frequency simulations and compact models compared with measurements for passive on-chip components: Research Articles | |
| https://doi.org/10.14293/p2199-8442.1.sop-math.pnc4h0.v1 | PMOR for Nanoelectronic Coupled Problems |
| https://doi.org/10.1007/978-3-319-75538-0_18 | Sparse Model Order Reduction for Electro-Thermal Problems with Many Inputs |
| https://doi.org/10.1007/978-3-319-75538-0_3 | Stability Analysis of Electromagnetic Transient Simulations |
| https://doi.org/10.1007/978-3-030-30726-4_20 | Test Cases for Power-MOS Devices and RF-Circuitry |
| https://doi.org/10.1007/978-3-030-30726-4_6 | Holistic / Monolithic Time Integration |
| https://doi.org/10.1007/978-3-030-30726-4_10 | Robust Shape Optimization under Uncertainties in Device Materials, Geometry and Boundary Conditions |
| https://doi.org/10.1007/978-3-030-30726-4_2 | EM-Equations, Coupling to Heat and to Circuits |
| https://doi.org/10.1007/978-3-030-30726-4_3 | Bond Wire Models |
| https://doi.org/10.1007/978-3-030-30726-4_1 | Nanoelectronic Coupled Problems Solutions – Highlights from the nanoCOPS Project |
| https://doi.org/10.1007/978-3-030-44101-2_17 | LinzFrame: A Modular Mixed-Level Simulator with Emphasis on Radio Frequency Circuits |
| https://doi.org/10.1007/978-3-030-30726-4_4 | Discretizations |
| https://doi.org/10.1183/13993003.congress-2024.oa3795 | Correlating volatile diagnostic biomarkers in exhaled breath to computed tomography imaging in an asbestos-exposed population |
| https://doi.org/10.1117/12.3062484 | MOVIQ: an end-to-end approach to enable high-resolution hyperspectral vision intelligence on board satellites |
| https://doi.org/10.1109/access.2025.3616647 | From Systematic to Intelligent: Assessing AI-Empowered Optimization Techniques for Analog Building Block Sizing |
| https://doi.org/10.1109/radecs66956.2025.11370347 | A Radiation-hardened Time-to-Digital Converter chip with 8 ps Single-Shot Precision |